Indian materials smart materials
News Insight

Advanced Materials World Congress will be held in Stockholm, Sweden during 23-26 August 2015.

Online Advertising

Adv Mat Lett is an official journal of IAAM

VBRI Press is a member of CrossRefDOAJ
Adv Mat Lett is a member of DOAJ

fullabstractpdf

Get PDF

Full Article

 Interfacial Mixing In Te/Bi Thin Film System

T. Diana, D. C. Agarwal, P. K. Kulriya, S. K. Tripathi, H. Nandakumar Sarma

Volume 5, Issue 4, Page 223-228 | DOI: 10.5185/amlett.2013.7510

Keywords:

 Bismuth telluride; ion beam mixing; swift heavy ion; RBS; AFM; XRD.

Abstract: 

 100 MeV Ag ions have been used to study the swift heavy ion (SHI) induced modification in Te/Bi bilayer system. The samples were analysed using Rutherford backscattering spectroscopy (RBS), Atomic force microscopy (AFM) and X-ray diffractometer (XRD). The elemental depth study with RBS results show a strong mixing between the top Te layer and the underlying Bi layer on irradiation. Surface roughness as calculated by AFM is found to increase from 8 to 30 nm on irradiation for the fluence 3x1013 ions/cm2.  XRD results confirm the formation of Bi-Te alloy phases on mixing and are expected to be formed due to the interfacial reaction taking place within the molten ion tracks. Ion beam mixing has the potential to induce the formation Bi-Te alloy thin films which are the promising candidate for thermoelectric applications near room temperature. Copyright © 2014 VBRI press. 

fullabstractpdf

Get PDF

Full Article