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Structural And Impedance Spectroscopy Analysis Of Ba(Fe0.5Nb0.5)O3-BaTiO3 ceramic System 

N. K. Singh, Pritam Kumar, Radheshyam Rai and Andrei L. Kholkin

Volume 3, Issue 4, Page 315-320 | DOI: 10.5185/amlett.2012.5345

Keywords: Dielectric properties; electrical properties; X-ray diffraction; scanning electron micrographs.

Abstract: 

Polycrystalline samples of BaFe0.5Nb0.5O3 and (1-x)Ba(Fe0.5Nb0.5)O3-xBaTiO3, [referred as BFN and BFN-BT respectively] (x = 0.00, 0.15 and 0.20) have been synthesized by a high-temperature solid-state reaction technique. The formation of the compound was checked by an X-ray diffraction (XRD) technique. The microstructure analysis was done by scanning electron micrograph. The spectroscopic data presented in impedance plane show the grain and grain boundary contributions towards electrical processes in the form of semi-circular arcs. Detailed studies of dielectric and impedance properties of the materials in a wide range of frequency (100Hz–5MHz) and temperatures (30-282°C) showed that these properties are strongly temperature and frequency dependent. Copyright © 2012 VBRI press.

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