Study Of Surface Morphology And Grain Size Of Irradiated MgO Thin Films
Jitendra Pal Singh, I. Sulania, Jai Prakash, S. Gautam, K. H. Chae, D. Kanjilal, K. Asokan
Volume 3, Issue 2, Page 112-117, Year 2012 | DOI: 10.5185/amlett.2012.1307
Keywords: MgO; atomic force microscopy; X-ray absorption spectroscopy
Present work reports 200 MeV Ag15+ irradiation induced effects on the surface morphology, grain size and local electronic structure in MgO thin films deposited by e-beam evaporation under ultra High vacuum. The grain size was found to decrease from 37 nm (pristine film) to 23 nm for the sample irradiated with fluence of 1×1012 ions/cm2 and thereafter it increases upto fluence of 5×1012 ions/cm2. Similar changes with ion fluence were also observed for surface roughness. Shifting and disappearance of peaks in X-ray absorption spectra with irradiation shows the electronic structure modification after irradiation. The detailed analysis of observed results has been done on the basis of existing theories. Copyright © 2012 VBRI Press.